Please use this identifier to cite or link to this item: http://repo.tma.uz/xmlui/handle/1/126
Title: SELF-OSCILLATIONS OF CURRENT IN SILICON: PHYSICAL PRINCIPLES, MECHANISMS AND APPLICATION
Authors: Nigora Abdullaeva1., Umida Mamadalieva2
Keywords: Self-oscillations, Silicon, Avalanche breakdown, Nonlinear effects, Thermal feedback, High-frequency signal generators, Semiconductor devices
Issue Date: 2024
Publisher: Journal o Academic Research and Trends in Educational Sciences
Abstract: The article discusses self-oscillatory processes in silicon semiconductor devices, such as diodes and transistors, based on nonlinear effects of interaction of electric current and voltage. Particular attention is paid to the physical mechanisms of self oscillations, including avalanche breakdown, thermal and electrical feedback, as well as their impact on the operation of silicon devices. Examples of the application of self-oscillatory modes in high-frequency signal generators and radio engineering devices are given. Methods for eliminating unwanted oscillations to ensure stable operation of circuits are also discussed.
URI: http://repo.tma.uz/xmlui/handle/1/126
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